The principle of X-ray Diffraction Analysis
The principle of X-ray diffraction is characterised by Bragg’s law of reflection:
A parallel incoming beam (red) is reflected on the so-called network-level of an atomic structure. Thereby, the lower X-ray covers a longer distance. This phase difference (yellow) is called path difference (t).
If the path difference corresponds to a multiple of an X-ray’s wavelength (l), X-ray reflections emerges through constructive interference.
Due to the atomic structure of every compound, an individual and typical series of X-ray reflections emerges which can then be classified to a specific substance.
In the field of X-ray diffraction, we are specialised on inorganic solids. Our customers value our know-how in the following fields:
- Techno-medical products (e.g. ceramic teeth, dental implants)
- Refractories (metallic silicon, silicon carbide, corundum, zircon, etc.)
- Clay and glass-ceramic manufactures (kaolin and silicate glass raw material)
- Electrochemical sensors
- Inorganic filter and pigment substances
- Cement raw materials (carbonate, sulphate, etc.)
- Construction, insulating and absorbing-sound materials
- Natural rock and stones (granite, marble, sand stone, slate)
- Industrial minerals (salts, ores, zeolites, quartz, diamond, etc.)